Determination of particle size distribution curves or particle agglomerates using sieving and/or X-ray sedimentometry (Sedigraph) and/or dynamic light scattering (DLS) techniques. When evaluating particles or agglomerates, analyses They are carried out in a series of sieves with standardized openings, in accordance with specific standards. In the case of particles with sizes between 0.1 µm and 100 µm, the analyses are carried out by sedimentation, based on Sotokes’ Law, in a particle analyzer (Sedigraph) that operates with an X-ray beam. For the analysis of particles of nanometric dimensions, the analyses are conducted by light scattering (DLS), with the ability to detect particles with sizes between 1 nm and 10 µm. The analyses apply to minerals and compounds of different natures, involving applications in the ceramic, pharmaceutical, paint, polymer, etc. industries. They can be useful for adjusting grinding and micronization systems, among many other applications.